CHEN, X.; LEI, Y.; LI, Y.; PARKINSON, S.; LI, X.; LIU, J.; LU, F.; WANG, H.; WANG, Z.; YANG, B.; YE, S.; ZHAO, Z. Large Models for Machine Monitoring and Fault Diagnostics: Opportunities, Challenges and Future Direction. Journal of Dynamics, Monitoring and Diagnostics, [S. l.], 2025. DOI: 10.37965/jdmd.2025.832. Disponível em: https://ojs.istp-press.com/dmd/article/view/832. Acesso em: 29 jun. 2025.